Burn-in Sockets
High Performance Test Sockets
Thermal Solutions
High Performance Boards
Spring Probes
Technology Advancements
Change Kits
Docking Systems/Manipulators
Receptacles
Test Sockets and Contactors
Antares Advanced Test Technologies provides a wide variety of high-precision test socket, contactor and lid solutions to meet virtually any IC Characterization, Failure Analysis, In-System Testing, or High-Volume Testing requirements. While all of our products share standard features such as best-in-class materials, field replaceable interconnects, and unsurpassed quality in manufacturing and design, all of our test sockets, contactors, and lids are custom designed and manufactured for your specific applications. Working closely with you to fully understand your needs, our engineers time and time again have proven the ability to rapidly develop comprehensive solutions that far exceed your expectations and continually outperform other manufacturer's products.

Innovative test socket and contactor solutions for
increased yield, profitability and efficiency that will
drive your semiconductor test costs down.


CSP Test Sockets
BGA/LGA Test Sockets
QFN/MLF Test Sockets
QFP, SOP, SOIC and other Leaded Devices
Lids
Strip Test Contactors
C Res Tester